Methodology of Production of Photo-Sensitive Elements on Ptsi Basis

Мұқаба

Дәйексөз келтіру

Толық мәтін

Ашық рұқсат Ашық рұқсат
Рұқсат жабық Рұқсат берілді
Рұқсат жабық Тек жазылушылар үшін

Аннотация

Schottky barrier diodes based on PtSi-Si contact can be used as detectors for registration of radiation in the infrared spectral region. However, the quantum efficiency of such receivers is very low compared to photodetectors based on narrow-gap semiconductors and p-n junctions. To increase the quantum efficiency of Schottky receivers, as it will be shown below, they are made in the form of the so-called “optical cavity”, and the thickness of PtSi should not exceed 100 A0. For this purpose we have developed a technological mode of multilayer metallization to obtain thin PtSi-Si contacts.

Толық мәтін

Рұқсат жабық

Авторлар туралы

E. Kerimov

Azerbaijan State Technical University

Хат алмасуға жауапты Автор.
Email: E_Kerimov.fizik@mail.ru
Әзірбайжан, Baku

Әдебиет тізімі

  1. Poole C., Owens F. Nanotechnologies. — Moscow: Technosphere, 2010. 336 p.
  2. Shapochkin M.B. Statistical physics / M.B. Shapochkin. M.: Publishing house of the Moscow Physical Society, 2004. 85 p.
  3. Goldade V.A., Pinchuk L.S. Physics of condensed state. Belarusian Science, 2009. 648 p.
  4. Parfenov V.V. Quantum-dimensional structures in electronics: optoelectronics. — Kazan: KSU, 2007. 16 p.
  5. Frolov V.D. Dimensional effect in the electron yield work / V.D. Frolov, S.M. Pimenov, V.I. Konov, E.N. Lubnin // Russian nanotechnologies. 2008. V. 3. P. 102.
  6. Kudrik Ya.Y., Shinkarenko V.V., Slepokurov V.S., Bigun R.I., Kudrik R.Y. Methods for Determination of Schottky Barrier Height from Volt-Ampere Characteristics // Optoelectronics and Semiconductor Technology, 2014, issue. 49, p. 21–28.
  7. Shik A. Ya., Bakueva L.G., Musikhin S.F., Rykov S.A. Physics of Low-Dimensional Systems. — Saint Petersburg: Nauka, 2001. 160 p.

Қосымша файлдар

Қосымша файлдар
Әрекет
1. JATS XML
2. Fig. 1. Technological scheme of fabrication of structures with BS on the basis of PtSi-Si contact

Жүктеу (1MB)

© Russian Academy of Sciences, 2024