Measurement of Low Polarization Losses of a Semiconductor Material in Finished Diodes

E. V. Semyonov; Семенов Э. В.; O. Yu. Malakhovskiy; Малаховский О. Ю.

doi:10.31857/S0032816223010226

Measurement of Low Polarization Losses of a Semiconductor Material in Finished Diodes

Autores: Semyonov E.V.¹, Malakhovskiy O.Y.²
Afiliações:
1. Tomsk State University of Control Systems and Radioelectronics
2. JSC “Scientific-Research Institute of Semiconductor Devices
Edição: Nº 2 (2023)
Páginas: 122-128
Seção: ЛАБОРАТОРНАЯ ТЕХНИКА
URL: https://transsyst.ru/0032-8162/article/view/670569
DOI: https://doi.org/10.31857/S0032816223010226
EDN: https://elibrary.ru/PWDAME
ID: 670569

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Resumo

A method for the measurement of semiconductor polarization losses in the depletion region of a finished diode is considered. It is shown that the measurement can be performed by comparing with a low-loss capacitor using general-purpose impedance meters in laboratories without stabilizing the microclimate and shielding the electromagnetic fields. To exclude the drift error under these conditions, multiple regular switching of the measurement object and low-loss capacitor is proposed. As a result, the polarization loss tangent of 1.9 × 10−4 was measured with an error of ±16%.

Sobre autores

E. Semyonov

Tomsk State University of Control Systems and Radioelectronics

Email: edwardsemyonov@narod.ru
634050, Tomsk, Russia

O. Malakhovskiy

JSC “Scientific-Research Institute of Semiconductor Devices

Autor responsável pela correspondência
Email: edwardsemyonov@narod.ru
634034, Tomsk, Russia

Bibliografia

Norwood M.H., Shatz E. // Proc. IEEE. 1968. V. 56. № 5. P. 788. https://doi.org/10.1109/PROC.1968.6408
Barrera J.S., Curby R.C., DeFevere D.C., Kwan F.S., Nevin L.J., Solomon R. // 6th European Microwave Conference. Rome, Italy, 14–17 September 1976. P. 14. https://doi.org/10.1109/EUMA.1976.332237
Poplavko Y.M. Electronic Materials. Principles and Applied Science. Oxford, United Kingdom: Elsevier, 2019. https://doi.org/10.1016/C2017-0-03281-0
Krupka J., Mouneyrac D., Hartnett J.G., Tobar M.E. // IEEE Trans. Microwave Theory and Techniques. 2008. V. 56. № 5. P. 1201. https://doi.org/10.1109/TMTT.2008.921652
Courtney W.E. // IEEE Trans. Microwave Theory and Techniques. 1977. V. 25. № 8. P. 697.
Малаховский О.Ю., Гущин С.М., Фотина Л.В., Скотников Н.В., Скробов Е.В. Патент РФ 165025 U1, МПК H01L 29/93 // Опубл. 27.09.2016. Бюл. № 27. https://new.fips.ru/Archive4/PAT/2016FULL/2016.09.27/DOC/RUNWU1/000/000/000/165/025/DOCUMENT.PDF
Baker-Jarvis J., Geyer R.G., Grosvenor J.H., Jr., Janezic M.D., Jones C.A., Riddle B., Weil C.M., Krupka J. // IEEE Trans. Dielectrics and Electrical Insulation. 1998. V. 5. № 4. P. 571.
Resonant Coaxial-Line. Model 34A. Instruction Manual. Boonton Electronics Corp. Parsippany, New Jersey, USA, 2002. http://ftb.ko4bb.com/manuals/23.106.56.14/ Boonton_34A_Resonant_Coaxial_Line_Manual.pdf
ГОСТ 18986.19–73. Варикапы. Метод измерения добротности. М.: ИПК Изд-во стандартов, 2004.
Семенов Э.В., Малаховский О.Ю. // Докл. Томск. гос. ун-та систем управления и радиоэлектроники. 2018. Т. 21. № 4. С. 11. https://doi.org/10.21293/1818-0442-2018-21-4-11-16
Yonekura T. // 10th IEEE Instrumentation and Measurement Technology Conference. Hamamatsu, Japan, 10–12 May 1994. P. 1004. https://doi.org/10.1109/IMTC.1994.351935
Shi L., He Y., Li B., Wu Y., Huang Y., Cheng T. // IEEE Trans. Instrumentation and Measurement. 2019. V. 68. № 9. P. 3244. https://doi.org/10.1109/TIM.2018.2878073
Zhang L., Zhang D. // IEEE Trans. Instrumentation and Measurement. 2015. V. 64. № 7. P. 1790. https://doi.org/10.1109/TIM.2014.2367775
Wang C. // IEEE Trans. Instrumentation and Measurement. 2015. V. 64. № 7. P. 1994. https://doi.org/10.1109/TIM.2014.2377991
Zakrzewski J., Wróbel K. // IEEE Trans. Instrumentation and Measurement. 2002. V. 51. № 6. P. 1358. https://doi.org/10.1109/TIM.2002.808030
Morawski R.Z., Podgórski A., Sutkowski K. // IEEE Trans. Instrumentation and Measurement. 1992. V. 41. № 6. P. 881. https://doi.org/10.1109/19.199426
Janik D. // IEEE Trans. Instrumentation and Measurement. 1983. V. 32. № 1. P. 232. https://doi.org/10.1109/TIM.1983.4315048