<?xml version="1.0" encoding="UTF-8"?>
<!DOCTYPE root>
<article xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xmlns:ali="http://www.niso.org/schemas/ali/1.0/" article-type="research-article" dtd-version="1.2" xml:lang="en"><front><journal-meta><journal-id journal-id-type="publisher-id">Russian Journal of Inorganic Chemistry</journal-id><journal-title-group><journal-title xml:lang="en">Russian Journal of Inorganic Chemistry</journal-title><trans-title-group xml:lang="ru"><trans-title>Журнал неорганической химии</trans-title></trans-title-group></journal-title-group><issn publication-format="print">0044-457X</issn><issn publication-format="electronic">3034-560X</issn><publisher><publisher-name xml:lang="en">The Russian Academy of Sciences</publisher-name></publisher></journal-meta><article-meta><article-id pub-id-type="publisher-id">690770</article-id><article-id pub-id-type="doi">10.31857/S0044457X25080123</article-id><article-id pub-id-type="edn">jjulyv</article-id><article-categories><subj-group subj-group-type="toc-heading"><subject>НЕОРГАНИЧЕСКИЕ МАТЕРИАЛЫ И НАНОМАТЕРИАЛЫ</subject></subj-group><subj-group subj-group-type="article-type"><subject>Research Article</subject></subj-group></article-categories><title-group><article-title xml:lang="en">Aerosol printing of electrochromic films based on nickel and tungsten doped V2O5</article-title><trans-title-group xml:lang="ru"><trans-title>Аэрозольная печать электрохромных пленок на основе V2O5, допированного никелем и вольфрамом</trans-title></trans-title-group></title-group><contrib-group><contrib contrib-type="author"><name-alternatives><name xml:lang="en"><surname>Gorobtsov</surname><given-names>P. Y.</given-names></name><name xml:lang="ru"><surname>Горобцов</surname><given-names>Ф. Ю.</given-names></name></name-alternatives><email>phigoros@gmail.com</email><xref ref-type="aff" rid="aff1"/></contrib><contrib contrib-type="author"><name-alternatives><name xml:lang="en"><surname>Fisenko</surname><given-names>N. A.</given-names></name><name xml:lang="ru"><surname>Фисенко</surname><given-names>Н. А.</given-names></name></name-alternatives><email>phigoros@gmail.com</email><xref ref-type="aff" rid="aff1"/></contrib><contrib contrib-type="author"><name-alternatives><name xml:lang="en"><surname>Simonenko</surname><given-names>N. P.</given-names></name><name xml:lang="ru"><surname>Симоненко</surname><given-names>Н. П.</given-names></name></name-alternatives><email>phigoros@gmail.com</email><xref ref-type="aff" rid="aff1"/></contrib><contrib contrib-type="author"><name-alternatives><name xml:lang="en"><surname>Simonenko</surname><given-names>T. L.</given-names></name><name xml:lang="ru"><surname>Симоненко</surname><given-names>Т. Л.</given-names></name></name-alternatives><email>phigoros@gmail.com</email><xref ref-type="aff" rid="aff1"/></contrib><contrib contrib-type="author"><name-alternatives><name xml:lang="en"><surname>Simonenko</surname><given-names>E. P.</given-names></name><name xml:lang="ru"><surname>Симоненко</surname><given-names>Е. П.</given-names></name></name-alternatives><email>phigoros@gmail.com</email><xref ref-type="aff" rid="aff1"/></contrib></contrib-group><aff-alternatives id="aff1"><aff><institution xml:lang="en">Kurnakov Institute of General and Inorganic Chemistry of the Russian Academy of Sciences</institution></aff><aff><institution xml:lang="ru">Институт общей и неорганической химии им. Н.С. Курнакова РАН</institution></aff></aff-alternatives><pub-date date-type="pub" iso-8601-date="2025-08-15" publication-format="electronic"><day>15</day><month>08</month><year>2025</year></pub-date><volume>70</volume><issue>8</issue><issue-title xml:lang="en">VOL 70, NO8 (2025)</issue-title><issue-title xml:lang="ru">ТОМ 70, №8 (2025)</issue-title><fpage>1081</fpage><lpage>1088</lpage><history><date date-type="received" iso-8601-date="2025-09-21"><day>21</day><month>09</month><year>2025</year></date></history><permissions><copyright-statement xml:lang="en">Copyright ©; 2025, Russian Academy of Sciences</copyright-statement><copyright-statement xml:lang="ru">Copyright ©; 2025, Российская академия наук</copyright-statement><copyright-year>2025</copyright-year><copyright-holder xml:lang="en">Russian Academy of Sciences</copyright-holder><copyright-holder xml:lang="ru">Российская академия наук</copyright-holder></permissions><self-uri xlink:href="https://transsyst.ru/0044-457X/article/view/690770">https://transsyst.ru/0044-457X/article/view/690770</self-uri><abstract xml:lang="en"><p>Vanadium(V) oxide films doped with 10 mol% NiO and 10 mol. % WO<sub>3</sub> were obtained by aerosol printing. In the first case, the film crystallizes in tetragonal β-V<sub>2</sub>O<sub>5</sub> modification with high texturing along the {200} crystallographic plane, while the material is X-ray amorphous when doped with tungsten. At nickel doping the film is formed by one-dimensional structures, while in the case of the sample V<sub>2</sub>O<sub>5</sub>–10 mol. % WO<sub>3</sub> — by particles of irregular shape or close to rounded. The values of electron yield work from the surface of the materials indicate high defectivity of the film containing WO<sub>3</sub>. Both samples demonstrate anodic electrochromism, but V<sub>2</sub>O<sub>5</sub>–10 mol. % NiO is characterized by higher values of optical contrast and coloring efficiency. The results of the study clearly reflect the influence of the nature of the considered dopants on the functional properties of the obtained materials and demonstrate the promising potential of the aerosol printing method for the formation of electrochromic films.</p></abstract><trans-abstract xml:lang="ru"><p>С помощью аэрозольной печати получены пленки оксида ванадия(V), допированного 10 мол. % NiO и 10 мол. % WO<sub>3</sub>. В первом случае пленка кристаллизуется в тетрагональной модификации β-V<sub>2</sub>O<sub>5</sub> с высоким текстурированием вдоль кристаллографической плоскости {200}, а при допировании вольфрамом материал является рентгеноаморфным. При допировании никелем пленка образована одномерными структурами, в случае V<sub>2</sub>O<sub>5</sub>‒10 мол. % WO<sub>3</sub> — частицами неправильной формы или близкой к округлой. Значения работы выхода электрона с поверхности материалов указывают на высокую дефектность плен- ки, содержащей WO<sub>3</sub>. Оба образца проявляют анодный электрохромизм, однако для V<sub>2</sub>O<sub>5</sub>‒10 мол. % NiO характерны более высокие значения оптического контраста и эффективности окрашивания. Результаты исследования наглядно отражают влияние природы рассматриваемых допантов на функциональные свойства полученных материалов и демонстрируют перспективность метода аэрозольной печати при формировании электрохромных пленок.</p></trans-abstract><kwd-group xml:lang="en"><kwd>vanadium oxide</kwd><kwd>tungsten oxide</kwd><kwd>thin films</kwd><kwd>aerosol printing</kwd><kwd>electrochromism</kwd><kwd>additive technology</kwd><kwd>electrochromic materials</kwd></kwd-group><kwd-group xml:lang="ru"><kwd>оксид ванадия</kwd><kwd>оксид вольфрама</kwd><kwd>тонкие пленки</kwd><kwd>аэрозольная печать</kwd><kwd>электрохромизм</kwd><kwd>печатные технологии</kwd><kwd>электрохромные материалы</kwd></kwd-group><funding-group/></article-meta></front><body></body><back><ref-list><ref id="B1"><label>1.</label><mixed-citation>Mortimer R.J., Dyer A.L., Reynolds J.R. // Displays. 2006. V. 27. № 1. P. 2. https://doi.org/10.1016/j.displa.2005.03.003</mixed-citation></ref><ref id="B2"><label>2.</label><mixed-citation>Mortimer R.J. // Annu. Rev. Mater. Res. 2011. V. 41. № 1. P. 241. https://doi.org/10.1146/annurev-matsci-062910-100344</mixed-citation></ref><ref id="B3"><label>3.</label><mixed-citation>Granqvist C.G., Arvizu M.A., Qu H.Y. et al. // Surf. Coat. Technol. 2019. V. 357. № January 2019. P. 619. https://doi.org/10.1016/j.surfcoat.2018.10.048</mixed-citation></ref><ref id="B4"><label>4.</label><mixed-citation>Granqvist C.G., Arvizu M.A., Bayrak Pehlivan et al. // Electrochim. Acta. 2018. V. 259. № January 2018. P. 1170. https://doi.org/10.1016/j.electacta.2017.11.169</mixed-citation></ref><ref id="B5"><label>5.</label><mixed-citation>Granqvist C.G. // Thin Solid Films. 2014. V. 564. № August 2014. P. 1. https://doi.org/10.1016/j.tsf.2014.02.002</mixed-citation></ref><ref id="B6"><label>6.</label><mixed-citation>Yang G., Zhang Y.M., Cai Y. et al. // Chem. Soc. Rev. 2020. V. 49. № 23. P. 8687. https://doi.org/10.1039/d0cs00317d</mixed-citation></ref><ref id="B7"><label>7.</label><mixed-citation>Gu C., Jia A.B., Zhang Y.M. et al. // Chem. Rev. 2022. V. 122. № 18. P. 14679. https://doi.org/10.1021/acs.chemrev.1c01055</mixed-citation></ref><ref id="B8"><label>8.</label><mixed-citation>Vlachopoulos N., Nissfolk J., Möller M. et al. // Electrochim. Acta. 2008. V. 53. № 11. P. 4065. https://doi.org/10.1016/j.electacta.2007.10.011</mixed-citation></ref><ref id="B9"><label>9.</label><mixed-citation>Cheng K.C., Chen F.R., Kai J.J. // Solar Energy Materials and Solar Cells. 2006. V. 90. № 7–8. P. 1156. https://doi.org/10.1016/j.solmat.2005.07.006</mixed-citation></ref><ref id="B10"><label>10.</label><mixed-citation>Scherer M.R.J., Li L., Cunha P.M.S. et al. // Advanced Materials. 2012. V. 24. № 9. P. 1217. https://doi.org/10.1002/adma.201104272</mixed-citation></ref><ref id="B11"><label>11.</label><mixed-citation>Jin A., Chen W., Zhu Q. et al. // Electrochim. Acta. 2010. V. 55. № 22. P. 6408. https://doi.org/10.1016/j.electacta.2010.06.047</mixed-citation></ref><ref id="B12"><label>12.</label><mixed-citation>Kim S., Taya M., Xu C. // J. Electrochem. Soc. 2009. V. 156. № 2. P. E40. https://doi.org/10.1149/1.3031978</mixed-citation></ref><ref id="B13"><label>13.</label><mixed-citation>Vernardou D. // Coatings. 2017. V. 7. № 2. P. 24. https://doi.org/10.3390/coatings7020024</mixed-citation></ref><ref id="B14"><label>14.</label><mixed-citation>Panagopoulou M., Vernardou D., Koudoumas E. et al. // Electrochim. Acta. 2019. V. 321. P. 134743. https://doi.org/10.1016/j.electacta.2019.134743</mixed-citation></ref><ref id="B15"><label>15.</label><mixed-citation>Panagopoulou M., Vernardou D., Koudoumas E. et al. // Electrochim. Acta. 2017. V. 232. P. 54. https://doi.org/10.1016/j.electacta.2017.02.128</mixed-citation></ref><ref id="B16"><label>16.</label><mixed-citation>Yao J., Li Y., Massé R.C. et al. // Energy Storage Mater. 2018. V. 11. P. 205. https://doi.org/10.1016/j.ensm.2017.10.014</mixed-citation></ref><ref id="B17"><label>17.</label><mixed-citation>Yue Y., Liang H. // Adv. Energy Mater. 2017. V. 7. № 17. P. 1. https://doi.org/10.1002/aenm.201602545</mixed-citation></ref><ref id="B18"><label>18.</label><mixed-citation>Liu M., Su B., Tang Y. et al. // Adv. Energy Mater. 2017. V. 7. № 23. P. 1700885. https://doi.org/10.1002/aenm.201700885</mixed-citation></ref><ref id="B19"><label>19.</label><mixed-citation>Zanarini S., Di Lupo F., Bedini A. et al. // J. Mater. Chem. C. 2014. V. 2. № 42. P. 8854. https://doi.org/10.1039/c4tc01123f</mixed-citation></ref><ref id="B20"><label>20.</label><mixed-citation>Panagopoulou M., Vernardou D., Koudoumas E. et al. // J. Phys. Chem. C. 2017. V. 121. № 1. P. 70. https://doi.org/10.1021/acs.jpcc.6b09018</mixed-citation></ref><ref id="B21"><label>21.</label><mixed-citation>Lin T.C., Jheng B.J., Huang W.C. // Energies (Basel). 2021. V. 14. № 8. P. 1. https://doi.org/10.3390/en14082065</mixed-citation></ref><ref id="B22"><label>22.</label><mixed-citation>Sonavane A.C., Inamdar A.I., Shinde P.S. et al. // J. Alloys Compd. 2010. V. 489. № 2. P. 667. https://doi.org/10.1016/j.jallcom.2009.09.146</mixed-citation></ref><ref id="B23"><label>23.</label><mixed-citation>Yoshino T., Kobayashi K., Araki S. et al. // Solar Energy Materials and Solar Cells. 2012. V. 99. P. 43. https://doi.org/10.1016/j.solmat.2011.08.024</mixed-citation></ref><ref id="B24"><label>24.</label><mixed-citation>Liu Q., Chen Q., Zhang Q. et al. // J. Mater. Chem. C. 2018. V. 6. № 3. P. 646. https://doi.org/10.1039/c7tc04696k</mixed-citation></ref><ref id="B25"><label>25.</label><mixed-citation>Avendaño E., Berggren L., Niklasson G.A. et al. // Thin Solid Films. 2006. V. 496. № 1. P. 30. https://doi.org/10.1016/j.tsf.2005.08.183</mixed-citation></ref><ref id="B26"><label>26.</label><mixed-citation>Niklasson G.A., Berggren L., Larsson A.L. // Solar Energy Materials and Solar Cells. 2004. V. 84. № 1–4. P. 315. https://doi.org/10.1016/j.solmat.2004.01.045</mixed-citation></ref><ref id="B27"><label>27.</label><mixed-citation>Ataalla M., Afify A.S., Hassan M. et al. // J. Non. Cryst. Solids. 2018. V. 491. № March. P. 43. https://doi.org/10.1016/j.jnoncrysol.2018.03.050</mixed-citation></ref><ref id="B28"><label>28.</label><mixed-citation>Chithambararaj A., Nandigana P., Kaleesh Kumar M. et al. // Appl. Surf. Sci. 2022. V. 582. № January. P. 152424. https://doi.org/10.1016/j.apsusc.2022.152424</mixed-citation></ref><ref id="B29"><label>29.</label><mixed-citation>Wang W.Q., Yao Z.J., Wang X.L. et al. // J. Colloid Interface Sci. 2019. V. 535. P. 300. https://doi.org/10.1016/j.jcis.2018.10.006</mixed-citation></ref><ref id="B30"><label>30.</label><mixed-citation>Wen R.T., Niklasson G.A., Granqvist C.G. // Solar Energy Materials and Solar Cells. 2014. V. 120. № January 2014. P. 151. https://doi.org/10.1016/j.solmat.2013.08.035</mixed-citation></ref><ref id="B31"><label>31.</label><mixed-citation>Ćatić N., Wells L., Al Nahas K. et al. // Appl. Mater. Today. 2020. V. 19. № June 2020. P. 100618. https://doi.org/10.1016/j.apmt.2020.100618</mixed-citation></ref><ref id="B32"><label>32.</label><mixed-citation>Serpelloni M., Cantù E., Borghetti M. et al. // Sensors (Switzerland). 2020. V. 20. № 3. P. 841. https://doi.org/10.3390/s20030841</mixed-citation></ref><ref id="B33"><label>33.</label><mixed-citation>Wilkinson N.J., Smith M.A.A., Kay R.W. et al. // International Journal of Advanced Manufacturing Technology. 2019. V. 105. № 11. P. 4599. https://doi.org/10.1007/s00170-019-03438-2</mixed-citation></ref><ref id="B34"><label>34.</label><mixed-citation>Agarwala S., Goh G.L., Yeong W.Y. // IOP Conf. Ser. Mater. Sci. Eng. 2017. V. 191. № 1. P. 012027. https://doi.org/10.1088/1757-899X/191/1/012027</mixed-citation></ref><ref id="B35"><label>35.</label><mixed-citation>Cooper C., Hughes B. // 2020 Pan Pacific Microelectronics Symposium, Pan Pacific 2020. 2020. P. 170. https://doi.org/10.23919/PanPacific48324.2020.9059444</mixed-citation></ref><ref id="B36"><label>36.</label><mixed-citation>Talledo A., Valdivia H., Benndorf C. // Journal of Vacuum Science &amp; Technology A: Vacuum, Surfaces, and Films. 2003. V. 21. № 4. P. 1494. https://doi.org/10.1116/1.1586282</mixed-citation></ref><ref id="B37"><label>37.</label><mixed-citation>Zou C., Fan L., Chen R. et al. // CrystEngComm. 2012. V. 14. № 2. P. 626. https://doi.org/10.1039/c1ce06170d</mixed-citation></ref><ref id="B38"><label>38.</label><mixed-citation>Khlayboonme S.T. // Results Phys. 2022. V. 42. № November 2022. P. 106000. https://doi.org/10.1016/j.rinp.2022.106000</mixed-citation></ref><ref id="B39"><label>39.</label><mixed-citation>Khlayboonme S.T., Thedsakhulwong A. // Mater. Res. Express. 2022. V. 9. № 7. P. 076401. https://doi.org/10.1088/2053-1591/ac827a</mixed-citation></ref><ref id="B40"><label>40.</label><mixed-citation>Asadov A., Mukhtar S., Gao W. // Journal of Vacuum Science &amp; Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena. 2015. V. 33. № 4. P. 041802. https://doi.org/10.1116/1.4922628</mixed-citation></ref><ref id="B41"><label>41.</label><mixed-citation>Gorobtsov P.Yu., Simonenko T.L., Simonenko N.P. et al. // Colloids and Interfaces. 2023. V. 7. № 1. P. 20. https://doi.org/10.3390/colloids7010020</mixed-citation></ref><ref id="B42"><label>42.</label><mixed-citation>Costa C., Pinheiro C., Henriques I. et al. // ACS Appl. Mater. Interfaces. 2012. V. 4. № 10. P. 5266. https://doi.org/10.1021/am301213b</mixed-citation></ref><ref id="B43"><label>43.</label><mixed-citation>Meyer J., Zilberberg K., Riedl T. et al. // J. Appl. Phys. 2011. V. 110. № 3. P. 033710. https://doi.org/10.1063/1.3611392</mixed-citation></ref><ref id="B44"><label>44.</label><mixed-citation>Zhang H., Wang S., Sun X. et al. // J. Mater. Chem. C. 2017. V. 5. № 4. P. 817. https://doi.org/10.1039/c6tc04050k</mixed-citation></ref><ref id="B45"><label>45.</label><mixed-citation>Choi S.G., Seok H.J., Rhee S. et al. // J. Alloys. Compd. 2021. V. 878. № October 2021. P. 160303. https://doi.org/10.1016/j.jallcom.2021.160303</mixed-citation></ref><ref id="B46"><label>46.</label><mixed-citation>Peng H., Sun W., Li Y. et al. // Nano Res. 2016. V. 9. № 10. P. 2960. https://doi.org/10.1007/s12274-016-1181-z</mixed-citation></ref><ref id="B47"><label>47.</label><mixed-citation>Gorobtsov P.Yu., Mokrushin A.S., Simonenko T.L. et al. // Materials. 2022. V. 15. № 21. P. 7837. https://doi.org/10.3390/ma15217837</mixed-citation></ref></ref-list></back></article>
