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<article xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xmlns:ali="http://www.niso.org/schemas/ali/1.0/" article-type="research-article" dtd-version="1.2" xml:lang="en"><front><journal-meta><journal-id journal-id-type="publisher-id">Journal of Experimental and Theoretical Physics</journal-id><journal-title-group><journal-title xml:lang="en">Journal of Experimental and Theoretical Physics</journal-title><trans-title-group xml:lang="ru"><trans-title>Журнал экспериментальной и теоретической физики</trans-title></trans-title-group></journal-title-group><issn publication-format="print">0044-4510</issn><issn publication-format="electronic">3034-641X</issn><publisher><publisher-name xml:lang="en">The Russian Academy of Sciences</publisher-name></publisher></journal-meta><article-meta><article-id pub-id-type="publisher-id">697964</article-id><article-id pub-id-type="doi">10.7868/S3034641X25120034</article-id><article-categories><subj-group subj-group-type="toc-heading" xml:lang="en"><subject>ATOMS, MOLECULES, OPTICS</subject></subj-group><subj-group subj-group-type="toc-heading" xml:lang="ru"><subject>АТОМЫ, МОЛЕКУЛЫ, ОПТИКА</subject></subj-group><subj-group subj-group-type="article-type"><subject>Research Article</subject></subj-group></article-categories><title-group><article-title xml:lang="en">THEORY OF SYSTEMS WITH SMALL BOUNDARY ROUGHNESS IN APPLICATION TO ELECTRON STATES IN QUANTUM CHANNELS, ELECTRO- AND HYDRODYNAMICS</article-title><trans-title-group xml:lang="ru"><trans-title>THEORY OF SYSTEMS WITH SMALL BOUNDARY ROUGHNESS IN APPLICATION TO ELECTRON STATES IN QUANTUM CHANNELS, ELECTRO- AND HYDRODYNAMICS</trans-title></trans-title-group></title-group><contrib-group><contrib contrib-type="author"><name><surname>Braginsky</surname><given-names>L. S</given-names></name><email>jetp@kapitza.ras.ru</email><xref ref-type="aff" rid="aff1"/><xref ref-type="aff" rid="aff2"/></contrib><contrib contrib-type="author"><name><surname>Entin</surname><given-names>M. V</given-names></name><email>jetp@kapitza.ras.ru</email><xref ref-type="aff" rid="aff1"/></contrib></contrib-group><aff id="aff1"><institution>Rahanov Institute of Semiconductor Physics, Siberian Branch of the Russian Academy of Sciences</institution></aff><aff id="aff2"><institution>Novosibirsk State University</institution></aff><pub-date date-type="pub" iso-8601-date="2025-12-15" publication-format="electronic"><day>15</day><month>12</month><year>2025</year></pub-date><volume>168</volume><issue>6</issue><issue-title xml:lang="en">VOL 168, NO6 (2025)</issue-title><issue-title xml:lang="ru">ТОМ 168, №6 (2025)</issue-title><fpage>765</fpage><lpage>771</lpage><history><date date-type="received" iso-8601-date="2025-12-07"><day>07</day><month>12</month><year>2025</year></date></history><permissions><copyright-statement xml:lang="en">Copyright ©; 2025, Russian Academy of Sciences</copyright-statement><copyright-statement xml:lang="ru">Copyright ©; 2025, Российская академия наук</copyright-statement><copyright-year>2025</copyright-year><copyright-holder xml:lang="en">Russian Academy of Sciences</copyright-holder><copyright-holder xml:lang="ru">Российская академия наук</copyright-holder></permissions><self-uri xlink:href="https://transsyst.ru/0044-4510/article/view/697964">https://transsyst.ru/0044-4510/article/view/697964</self-uri><abstract xml:lang="en"><p>--</p></abstract><trans-abstract xml:lang="ru"><p>The solutions of Laplace and wave equations in the systems with small one-dimensional surface roughness are studied. The conformal mapping technique is used. This permits the exact solution of Laplace equation and approximate solution of the wave one, if the characteristic height of the roughnesses is smaller then the wavelength. It is shown that such a rough boundary can be replaced by a flat one, however, shifted with regard to the mean surface position. This is correct, if the roughnesses are small, but maybe not smooth. Different physical problems at such boundary are reduced to this formulation. Namely, the effective capacity of a flat capacitor, the resistivity of a conducting layer, reflection of the electromagnetic wave on the metal surface, the laminar hydrodynamic flow in the rough 2D tube, the edge effects of the electron states in a quantum layer, the wave resistance of a planar waveguide.</p></trans-abstract></article-meta></front><body></body><back><ref-list><ref id="B1"><label>1.</label><mixed-citation>M. A. Lavrentiev and B. V. Shabat, Methods of Complex Function Theory, Nauka, Moscow (1987).</mixed-citation></ref><ref id="B2"><label>2.</label><mixed-citation>A. V. Chaplik and M. V. Entin, Energy Spectrum and Electron Mobility in a Thin Film with Nonideal Boundary, JETP 55, 990 (1968.).</mixed-citation></ref><ref id="B3"><label>3.</label><mixed-citation>R. E. Prange and T. W. Nee, Quantum Spectroscopy of the Low-Field Oscillations in the Surface Impedance, Phys. Rev. 168, 779 (1968).</mixed-citation></ref><ref id="B4"><label>4.</label><mixed-citation>T. Ando, A. B. Fowler, and F. Stern, Electronic Properties of Two-Dimensional Systems, Rev. Mod. Phys. 54, 437 (1982).</mixed-citation></ref><ref id="B5"><label>5.</label><mixed-citation>L. S. Braginskii and I. A. Gilinskii, Dokl. Akad. Nauk SSSR 293, 1097 (1987) [Sov. Phys. Dokl. 32, 297 (1987)].</mixed-citation></ref><ref id="B6"><label>6.</label><mixed-citation>E. L. Feinberg, Propagation of Radionwaves along the Earth's Surface [in Russian], Izd. AN SSSR, Moscow (1961).</mixed-citation></ref><ref id="B7"><label>7.</label><mixed-citation>P. I. Arseev, Perturbation Theory for the Green's Function of an Electromagnetic Field on a Rough Surface, Zh. Eksp. Teor. Fiz. 93, 464 (1987) [JETP 65, 262 (1987)].</mixed-citation></ref><ref id="B8"><label>8.</label><mixed-citation>R. Z. Vitlina and A. M. Dykhne, Reflection of Electromagnetic Waves from a Surface with a Low Relief, Zh. Eksp. Teor. Fiz. 99, 1758 (1991) [JETP 72, 983 (1991)].</mixed-citation></ref><ref id="B9"><label>9.</label><mixed-citation>G. V. Rozhnov, Zh. Eksp. Teor. Fiz. 94, 50 (1988) [Sov. Phys. JETP 67, 240 (1988)].</mixed-citation></ref><ref id="B10"><label>10.</label><mixed-citation>Y. C. Huang, C. Williams, and H. Smith, Direct Comparison of Cross-Sectional Scanning Capacitance Microscope Dopant Profile and Vertical Secondary Ion-Mass Spectroscopy Profile, J. Vacuum Sci. Technol. B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena 14, 433 (1996).</mixed-citation></ref><ref id="B11"><label>11.</label><mixed-citation>R. C. Barrett and C. F. Quate, Charge Storage in a Nitride-Oxide-Silicon Medium by Scanning Capacitance Microscopy, J. Appl. Phys. 70 2725 (1991).</mixed-citation></ref><ref id="B12"><label>12.</label><mixed-citation>N. C. Bruce, A. Garcia-Valenzuela, and D. Kouznetsov, Rough-Surface Capacitor: Approximations of the Capacitance with Elementary Functions, J. Phys. D: Appl. Phys. 32, 2692 (1999).</mixed-citation></ref><ref id="B13"><label>13.</label><mixed-citation>D. R. Steinhauer, C. P. Vlahacos, S. K. Dutta, F. C. Wellstood, and S. M. Anlage, Surface Resistance Imaging with a Scanning Near-Field Microwave Microscope, Appl. Phys. Lett. 71, 1736 (1997).</mixed-citation></ref><ref id="B14"><label>14.</label><mixed-citation>C. P. Vlahacos, R. C. Black, S. M. Anlage, A. Amar, and F. C. Wellstood, Nearfield Scanning Microwave Microscope with 100 μm Resolution, Appl. Phys. Lett. 69, 3272 (1996).</mixed-citation></ref><ref id="B15"><label>15.</label><mixed-citation>Yu Luo, J. B. Pendry, and A. Aubry, Surface Plasmons and Singularities, Nano Lett. 10, 4186 (2010); Yu Luo, A. Aubry, and J. B. Pendry, Electromagnetic Contribution to Surface-Enhanced Raman Scattering from Rough Metal Surfaces: A Transformation Optics Approach, Phys. Rev. B 83, 155422 (2011).</mixed-citation></ref><ref id="B16"><label>16.</label><mixed-citation>Zeev Nehari, Conformal Mapping, Dover Publications, New York (1982).</mixed-citation></ref><ref id="B17"><label>17.</label><mixed-citation>https://en.wikipedia.org/wiki/Schwarz-Christoffelmapping</mixed-citation></ref></ref-list></back></article>
